Curriculum vitae Name Gian Bartolo Picotto Home address

Curriculum vitae
Name
Home address
Nationality
Date of birth
Address
Phone
E-mail
Education
Job position
Expertise
Gian Bartolo Picotto
Via Barge 9, 12031 Bagnolo Piemonte (CN), Italy
Italian
October 17th, 1956
Istituto Nazionale di Ricerca Metrologica (INRIM)
Strada delle Cacce 91, 10135 Torino, Italy
+39 0113919969
[email protected]
Degree in Physics, 1987, University of Torino
Senior Researcher at the Istituto Nazionale di Ricerca Metrologica (INRIM), Italy
Length Metrology, dimensional measurements, interferometry, optical frequency standards, surface metrology,
micro and nanometrology, scanning probe microscopy.
Activity
1978-1989
In 1978 he joined the CNR-Istituto di Metrologia (now Istituto Nazionale di Ricerca Metrologica, INRIM),
where he has been involved in the field of optical frequency standards and laser spectroscopy. In this period he
has got experience in the development of iodine-stabilized He-Ne lasers (recommended radiations for the unit of
length) and related spectroscopic techniques;
1990-today
Since 1990 he has been responsible for the research on sub-micron surface metrology. His main activities and
interests are in high-resolution laser interferometry, capacitance-based displacement transducers, scanning probe
microscopy, stylus and optical profilometry, diameter and linear gauges, gage blocks, linescales, roughness and
step-height standards, nanoparticles and 1D /2D gratings;
2002-2007
Head of the Length Section of the CNR-Istituto di Metrologia, and Responsible (up to May 2007) of the
“Length Metrology” of INRIM.
Publications, patents
He has over 70 publications on international journals and conference proceedings. He is co-inventor of three patents on capacitive
sensors and related electronics for displacement measurements.
Laboratory inter-comparisons
Contact person of INRIM (formerly of CNR-IMGC) in several international comparisons on diameter standards, step-gauges,
linescales, roughness and step-height standards, thread gauges, linewidth standards and nanoparticles.
Coordinator of the EURAMET.L-K4.2016 comparison on calibration of diameter gauges. He coordinated the EURAMET.LK4.2005 comparison, and the EURAMET project 866 on the interferometric calibration of micro- and nanodisplacement
actuators.
CMC (Calibration Measurement Capabilities) reviewer (diameter standards) of the TC-Length of EURAMET.
Technical Committees / Working Groups
2002 – 2013
EURAMET - TC Length (Technical Committee of Length), Delegate, contact person for Length as
representative of INRIM (Italy);
2003-2007
WGDM (Working Group on Dimensional Metrology) of the CIPM-CCL, Delegate as representative of INRIM
(Italy);
2009 - today
member of the Working Group WG-N and Discussion Groups (DG4, DG5, DG7 and DG8) of the CCL
(Consultative Committee for Length);
2005 - today
UNI – Committee GPS CT047, Member / Working Group GL2 “Surfaces”, Coordinator;
2007
Technical expert of INRIM for the TP3 (Length) of iMERA+ (www.emrponline.eu).
Peer review for laboratory assessment
Technical Assessor of the Cofrac (France) - Assessment (2007, 2014, and 2016) of the dimensional calibration laboratories of the
Laboratoire National d’Essais (LNE);
Technical Assessor of the Turkak (Turkey) - Assessment (2007, 2010, 2012, and 2014) of the dimensional calibration laboratories
of the National Metrology Institute of Turkey (UME);
2004 - today
Technical Assessor (dimensional measurements) of the Italian accreditation body (ACCREDIA, formerly SIT).
He coordinated national inter-laboratory comparisons on diameter gauges, roughness and step-height standards.
Others
Referee for Measurement Science and Technology, and occasionally for J. Vac. Sci. & Technol. B, Review of Scientific
Instruments, Precision Engineering, Nanotechnology, Journal of Physics B: Atomic, Molecular and Optical Physics, Journal of
Optics A, Journal of Micromechanics and Microengineering, IEEE Transactions on Automation Science and Engineering, and
CIRP Journal of Manufacturing Science and Technology.
Member of the Scientific Committee of the international Seminars Nanoscale (www.nanoscale.de)
Recent Publications
- A. Balsamo, R. Frizza, G. B. Picotto, and D. Corona, Design, manufacturing and calibration of a large ring segment, Proc.
of the 16th EUSPEN international conference, May 30th – 3rd June 2016, Nottingham, UK, P 1.49, ISBN 14: 978-0-95667908-7
- F. Pollastri and G. B. Picotto, Surface texture measurements of gear tooth, Proc. of the 16th EUSPEN international
conference, May 30th – 3rd June 2016, Nottingham, UK, P 1.43, ISBN 14: 978-0-9566790-8-6
- C W Jones, M Santiano, S Downes, R Bellotti, D O’Connor, and G B Picotto, A universal substrate sample fixture for efficient
multi-instrument inspection of large, flexible substrates, with absolute position registration support, Proc. of the 16th
EUSPEN international conference, May 30th – 3rd June 2016, Nottingham, UK, P 1.63, ISBN 14: 978-0-9566790-8-6
- Vedran Mudronja, Vedran Šimunovic, Bojan Acko, Michael Matus, Edit Bánréti, Dicso István, Rudolf Thalmann, Antti
Lassila, Lauri Lillepea, Gian Bartolo Picotto, Final report on EURAMET.L-S21: `Supplementary comparison of parallel
thread gauges', Metrologia, Volume 52, Technical Supplement, 04003
- R Thalmann, A Nicolet, F Meli, G B Picotto, M Matus, L Carcedo, B Hemming, O Ganioglu, L De Chiffre, F Saraiva, S
Bergstrand, S Zelenika, A Tonmueanwai, C -L Tsai, W Shihua, O Kruger, M M de Souza, J A Salgado and Z Ramotowski, KEY
COMPARISON, Calibration of surface roughness standards, Metrologia, 2015, 53, Tech. Suppl., 04001
- R. Bellotti, M. Franco, G. B. Picotto and M. Pometto, Renewal of the gage-block interferometer at INRIM, Proc. MacroScale
2014, Physikalisch-Technische Bundesanstalt (PTB), 2015. doi: 10.7795/810.20150331A
- R. Bellotti and G. B. Picotto, Recent advances of the metrological AFM at INRIM, Proc. SPIE 9173, 917304, 2014.
doi:10.1117/12.2061954
- M. Pisani, A. Yacoot, P. Balling, N. Bancone, C. Birlikseven, M. Çelik, J. Flügge, R. Hamid, P. Köchert, P. Kren, U. Kuetgens,
A. Lassila, G.B. Picotto, E. Şahin, J. Seppä, M. Tedaldi, C. Weichert: Comparison of the performance of the next generation of
optical interferometers. Metrologia, Vol. 49, 455-467, 2012
- F. Meli, T. Klein, E. Buhr, C. G. Frase, G. Gleber, M. Krumrey, A. Duta, S. Duta, V. Korpelainen, R. Bellotti, G. B. Picotto,
R. D Boyd and A. Cuenat, Traceable size determination of nanoparticles, a comparison among European metrology institutes,
Meas. Sci. Technol. 23 125005, 2012
- J. Seppa, V. Korpelainen, M. Merimaa, G. B. Picotto and A. Lassila, A method for linearization of a laser interferometer
down to the picometre level with a capacitive sensor, Meas. Sci. Technol. 22 (9) 094027, 2011
- G. Baršić, S. Mahović, G. B. Picotto, M. A Amer and B. Runje, Groove depth measurements on roughness reference standards
of the Croatian National Laboratory for Length (LFSB), Meas. Sci. Technol. 22 (9) 094020 , 2011
- G.B. Picotto, R. Bellotti, M. Pometto and M. Santiano, The INRIM 1D comparator with a new interferometric set-up for
measurement of diameter gauges and linear artefacts, Proc. MacroScale 2011, Physikalisch-Technische Bundesanstalt (PTB),
2013. doi: 0.7795/810.20130620o
Torino, Jan. 2017